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Manufacturing Quality · Process RCARCA-2026-MFG-0231

Manufacturing Root Cause Report

Elevated Module Weld Resistance

A battery-module interconnect defect traced past a convincing supplier-lot Pareto to its real origin on the production floor: weld-electrode tip wear under a lax dressing interval — and the SPC fix that closes it.

Prepared byM. Mazouchi — VHM & Diagnostics
ProcessTab/busbar resistance welding
Sample600 modules, EOL-instrumented
StatusRoot cause confirmed
DispositionContainment + PM fix validated
Executive Summary

A fraction of battery modules failed the end-of-line (EOL) interconnect-resistance spec (> 80 µΩ), with field data showing these joints run hot and drift higher over service. A 600-module study with full production traceability isolated the defect to tab-to-busbar weld-electrode tip wear: as the tip wears between dressings, the weld nugget shrinks and joint resistance climbs past a knee.

The defects clustered on supplier foil lot L2 — but L2 was simply the lot routed to Station B, whose dressing interval (4000 welds vs ~1500 on the other lines) let the electrode reach deep wear. Holding electrode wear constant, both the lot and the station associations vanish. Tightening the dressing interval lifts process capability from Cpk to Cpk and removes the escape; a 100% EOL resistance screen contains the field risk in the interim.

Principal Finding

The cause is a tooling-maintenance defect (electrode dressing interval), not a material defect (supplier lot) and not a station hardware defect. The supplier-lot Pareto that triggered the investigation is a routing artifact; a supplier corrective action would have changed nothing.

1 — Symptom & Scope

A resistance the spec won't allow

Good joints sit near 35 µΩ. A tail of modules is landing well above 80.

End-of-line testing flags modules whose tab-to-busbar interconnect resistance exceeds the 80 µΩ upper spec limit. The concern is not cosmetic: a high-resistance joint dissipates more power, runs hotter under fast charge, and drifts further upward in service — raising the risk of thermal flags and warranty returns. The escape rate at EOL was running near , far above target.

Because every module carries full production traceability — station, electrode state, supplier lot, line speed, shift, plant conditions — the data supports a disciplined attribution rather than a guess. The challenge, as always, is that several of those variables move together.

2 — Data & Traceability

The instrumented build

600 modules were logged at EOL with their full genealogy. Each record carries the weld station, the electrode wear (welds since the last tip dressing), the supplier foil lot, process parameters, plant conditions, and the measured interconnect resistance.

FieldMeaningRole
electrode_cycleswelds since last tip dressingPrimary cause
stationweld station A / B / CWear-rate driver (dressing interval)
supplier_lottab/foil supplier lotConfounded proxy
weld_energy_pctweld schedule energyIn control (checked)
line_speed, humiditythroughput, plant RHDecoys
interconnect_R_uohmEOL joint resistanceTarget variable
field_growthin-service resistance driftPrognosis input

The dataset is synthetic, generated from a process model with a known ground truth so the method can be graded. Electrode wear is the only true driver of resistance; the supplier lot is built as a routing-linked proxy with no metallurgical path to the defect.

3 — Candidate Hypotheses

The manufacturing suspects

Seven hypotheses were carried, spanning the manufacturing failure-mode families:

#HypothesisFamilyFalsifiable prediction
H1Supplier foil lot varianceMaterialDefect tracks lot; foil resistivity out of spec
H2Electrode tip wearToolingR climbs with cycles-since-dress; resets at dressing
H3Station / fixture hardwareEquipmentOne station defective independent of wear
H4Weld-schedule energy driftProcessR tracks weld energy out of band
H5Line speed / cycle timeProcessR tracks throughput
H6Operator / shiftProcessR splits by shift
H7Plant humidity / oxidationEnvironmentalR tracks RH

As before, several are not rivals but links in a chain: a station's dressing interval (H3) governs electrode wear (H2), which sets the joint resistance. Recognizing that prevents mistaking the station for the fix.

4 — The Misleading Pareto

Where a hasty investigation ends

The first instinct in a quality escape is a Pareto of defects by attribute. Sorted by supplier lot, it points an unambiguous finger:

Figure 1 — Defect Pareto by supplier lot
The tempting conclusion. Lot L2 accounts for the large majority of escapes. A supplier 8D and a containment hold on L2 write themselves. The problem: this chart says nothing about why L2 — and the real reason is not the foil.

A Pareto ranks association, not causation. To go further we need the continuous process variables and the discipline of holding them against one another.

5 — Statistical Screen

What actually tracks the resistance

Figure 2 — Raw correlation with interconnect resistance
Three correlated suspects. Electrode wear leads decisively (r = ), with Station B and lot L2 trailing — both inflated because they ride along with wear. Weld energy, line speed and humidity are flat: the process parameters are in control.

Electrode wear is far and away the strongest signal, but station and lot are non-trivial, and a Pareto would have stopped at the lot. The four-gate test — association, significance, materiality, mechanism — is what separates them.

6 — Rejecting the Supplier Lot (H1)

A routing artifact, not a material defect

Lot L2's correlation has a mundane explanation: L2 was the foil lot fed predominantly to Station B. It is a label for "this module was built on Station B," nothing more. Two tests confirm it.

First, holding electrode wear constant collapses both the lot and the station associations to noise, while wear itself survives intact:

Figure 3 — Raw vs partial correlation (control for electrode wear)
Raw Partial (wear held constant)
The collapse. Lot L2 falls from r = to ≈ , and Station B from to ≈ — both fully mediated by wear. Electrode wear, controlled for lot, holds at . The mirror test settles direction.

Second, the mechanism gate: foil resistivity for lot L2 is within material spec, so there is no metallurgical pathway by which L2 could add tens of µΩ to a joint. Strong correlation, no mechanism — the signature of a confounder. H1 is rejected; the supplier hold is released.

7 — Abduction: Wear, Not Lot or Station

Following the chain to the dressing interval

The regression makes the mediation explicit. Lot alone explains little; adding station helps; adding the wear term dominates and drives the lot and station coefficients to near zero:

ModelLot coef.Station coef.
R ~ lot
R ~ lot + station
R ~ lot + station + wear

This is the abductive step. The best explanation for "Station B is loud, but only its high-wear modules, and lot L2 just happens to ride along" is that the actionable cause is neither the station nor the lot but the electrode condition — specifically, welds since the last dressing. Station B is implicated only because its lax dressing interval lets wear run deep. The refined, testable claim: resistance is set by cycles-since-dressing, and resets when the tip is dressed. That prediction is the subject of §8.1, and it is decisive.

Why this matters operationally Misreading station as the cause leads to replacing or re-qualifying Station B hardware — expensive and ineffective. The cause is a maintenance schedule. The right fix is a calendar, not a capital purchase.
8 — Process & Metallurgical Confirmation

Where the data meets the weld

8.1 — The control chart: a tooling-wear sawtooth

If wear-since-dressing is the cause, resistance on Station B should climb across each dressing cycle and snap back when the tip is dressed — a sawtooth, not a random scatter. It does exactly that:

Figure 4 — SPC control chart, Station B (production order)
The decisive signature. Resistance ramps up as the electrode wears and drops at each dressing (vertical resets), breaching the 80 µΩ spec near the top of every ramp. No material or environmental cause produces this shape — it is the fingerprint of tool wear.

8.2 — Weld strength falls as resistance rises

The metallurgical companion: as the tip wears, the weld nugget shrinks, so pull strength drops exactly as resistance climbs — two faces of the same loss of joint quality.

Figure 5 — Weld pull strength & resistance vs electrode wear
Pull strength Interconnect resistance
One mechanism, two symptoms. Past the wear knee (~ cycles) strength and resistance diverge together. This is the physical pathway the statistics pointed to — a shrinking nugget, not a resistive foil.

8.3 — Process capability

Capping the dressing interval so the tip never reaches deep wear transforms the resistance distribution relative to the spec limit:

Figure 6 — Process capability before vs after
Current (lax dressing) Tightened dressing
From incapable to capable. The current process has a long tail across the 80 µΩ limit — Cpk ≈ , escape . Tightening the dressing interval pulls the whole distribution down to Cpk ≈ with effectively zero escape.
Root Cause Statement

Confirmed root cause

Tab-to-busbar weld interconnect resistance exceeds spec because the weld-electrode tip is allowed to reach deep wear before dressing. On Station B the dressing interval (≈4000 welds) lets the tip wear well past the quality knee, shrinking the weld nugget and raising joint resistance above 80 µΩ. Supplier lot L2 and "Station B" are correlated proxies — L2 was routed to B, and B is the line with the lax interval — neither is causal once electrode wear is held constant. Station B mean resistance is µΩ ( escape) versus µΩ on lines A/C.

Disposition: H2 (electrode wear) confirmed; H3/H6 act only through it. H1, H4, H5, H7 rejected (Appendix A).

9 — Diagnostic Decision Tree

The screen, distilled

The recurring per-module decision compresses to three checks, evaluable at EOL or on the line — each leaf names cause and action. Thresholds come from the data (spec 80 µΩ; the wear knee near 1200 cycles, deep wear past ~3000).

EOL interconnect R > 80 µΩ (USL) ?
NO ↓
In spec — pass
YES ↓
electrode cycles-since-dress in deep wear (> ~3000) ?
YES ↓
ROOT CAUSE — electrode tip wear (lax dressing). Dress tip now; tighten PM interval; 100% EOL resistance screen; quarantine modules since last dressing.
NO ↓
weld energy out of band ?
YES ↓
Weld-schedule drift — recalibrate station energy/force
NO ↓
Rare — inspect fixture/material & contamination
10 — Containment & Corrective Action

Closing the escape

The fix is a maintenance and screening change inside the existing line — no new hardware. The process and its SPC feedback loop:

Figure 7 — Process flow with SPC dressing-control loop
Where the fix lives. EOL resistance feeds an SPC control chart; crossing the action limit triggers an electrode dressing (and, optionally, adaptive weld-energy compensation as the tip wears). The 100% EOL screen is the containment net that prevents field escapes while the PM interval is corrected.

The causal chain and the confounder, side by side:

Figure 8 — Root-cause chain & the lot confounder
One chain, one red herring. Lax dressing → deep wear → small nugget → high resistance → field drift. The dashed branch is lot L2: routed to Station B, correlated with the defect, metallurgically inert.
ActionTypeEffect
Tighten electrode dressing intervalCorrective (PM)Cpk
100% EOL resistance screenContainmentBlocks field escapes now
Adaptive weld-energy compensationRobustnessFlattens wear sensitivity
Quarantine since-last-dressingContainmentRecovers suspect population
11 — Prognosis

Setting the interval, forecasting the field

Because the cause is mechanistic, both the line fix and the field risk can be forecast. First, the dressing interval is an optimization: escape rate rises sharply with cycles-since-dress, so the interval is chosen to hold escape below target.

Figure 9 — Defect escape vs dressing interval
The maintenance set-point. Escape is negligible until the interval lets wear cross the knee, then climbs steeply. Holding escape under a 0.5% target sets the maximum dressing interval — a direct, quantitative PM specification rather than a guess.

Second, the field consequence of not screening: above-spec joints drift upward in service and eventually trip thermal flags.

Figure 10 — Field thermal-flag probability over service
Unscreened EOL-screened
The containment payoff. Without the EOL screen, the at-risk fraction reaches a chance of a field thermal flag within four years; with the screen it stays at essentially zero. This is the warranty exposure the 100% screen removes while the dressing interval is corrected upstream.
12 — Recommendations

Plant action

Immediate containment: institute a 100% EOL interconnect-resistance screen across all stations, and quarantine modules built on Station B since its last electrode dressing. Corrective action: set every station's dressing interval from the escape-vs-interval curve at the 0.5% target, add an SPC control chart on EOL resistance with an action limit that auto-triggers dressing, and pilot adaptive weld-energy compensation to flatten the wear sensitivity. Release the supplier hold on lot L2 — it was never causal. Verify by confirming the sawtooth no longer breaches spec and Cpk holds above target on each line, and track field thermal-flag rate by build-since-dressing cohort.

Appendix A — Hypothesis Disposition

Kept or dropped

#HypothesisDispositionDecisive evidence
H1Supplier foil lotRejectedCollapses under wear control; foil resistivity in spec
H2Electrode tip wearConfirmedSurvives control; sawtooth; strength–resistance link
H3Station hardwareRejected*Effect fully mediated by wear (lax dressing), not hardware
H4Weld energy driftRejectedEnergy in control; flat correlation
H5Line speedRejectedFlat correlation
H6Operator / shiftRejectedNo split once wear controlled
H7Plant humidityRejectedFlat correlation

* Station B is the locus, but the actionable cause is its dressing interval, not station hardware.

Appendix B — Code & Data

Reproducibility

The dataset and full analysis ship alongside as weld_resistance_rca.py (process-model generator + diagnostic pipeline) and weld_modules.csv (600-module mockup). The core of the generator:

# resistance climbs super-linearly past the electrode-wear knee
wear_term = max((electrode_cycles - KNEE)/1000, 0) ** 1.6
R = 35 + 17*wear_term + 0.05*(weld_energy-100) + lot_resistivity + noise
defect = R > 80                              # microohm spec limit

# confounder: lot L2 routed mostly to Station B (the lax line)
p_L2 = where(station=="B", 0.80, 0.12)       # proxy, foil in spec
dress_interval = {"A":1500, "B":4000, "C":1700}  # B is lax

The pipeline reproduces every figure: the Pareto, correlation screen, partial-correlation confounder test (lot → r ≈ ), staged regression (R² ), the SPC sawtooth, capability (Cpk ), and the prognosis.